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John Fletcher


John Fletcher
+46 31 786 9105

Room number: 4032
Postal Address: Kemigården 4, 412 96 Göteborg
Visiting Address: Kemigården 4 , 412 96 Göteborg

Department of Chemistry & Molecular Biology (More Information)
Box 462
405 30 Göteborg
Fax: +46 31 786 2599
Visiting Address: Medicinaregatan 9 C , 413 90 Göteborg

About John Fletcher


My groups research is focused on the development and application of imaging mass spectrometry for biological analysis. Mass spectrometry provides molecular specific chemical information without the need to incorporate exogenous labels. When used in an imaging modality this chemical precision is combined with precise spatial distribution. Secondary ion mass spectrometry (SIMS) uses a focused ion beam to probe the surface of a sample and the nature of the ion beam fired at the sample can ultimately determine what chemical species are detected in the mass spectrometer.
As there is a constant demand for more signal at higher resolution and so ion beam development is an active area of research particularly using new gas cluster ion beam technology. For biological sample analysis ensuring that the data generated is representative of the "live" sample means that methods to prepare and analyse biological specimen in the vacuum environment required for imaging SIMS are critical.
Combining the new ion beams with optimal sample preperation provides a route to identifying lipidomic changes on a sub-cellular scale, potentially in 3D, in order elucidate the underlying chemical processes involved in disease progression and treatment.


Current group members

Kelly Dimovska Nilsson 

Ibrahim Kaya

Sanna Sämfors

Teaching and Departmental Responsibilities

KEM070 - Basic Analytical Chemistry

KEM081 - Advanced Analytical Chemistry

KEA310 - Introduction to Analytical Chemistry

Analytical Chemistry Project Contact

Coordinator of Chemistry Masters Program

Departmental Strategy Board Member




Latest publications

Mass Spectrometry Imaging and Integration with Other Imaging Modalities for Greater Molecular Understanding of Biological Tissues
T. P. Siegel, G. Hamm, J. Bunch, J. Cappell, John S. Fletcher et al.
Molecular Imaging and Biology, Review article 2018
Review article

Showing 41 - 50 of 87


Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams
Sadia Sheraz, Andrew Barber, John S. Fletcher, Nicholas P. Lockyer, John C. Vickerman
Analytical Chemistry, Journal article 2013
Journal article

Evaluating the challenges associated with time-of-fight secondary ion mass spectrometry for metabolomics using pure and mixed metabolites
John S. Fletcher, Helen L Kotze, Emily G. Armitage, Nicholas P Lockyer, John C. Vickerman
Metabolomics, Journal article 2013
Journal article

ToF-SIMS as a tool for metabolic profiling small biomolecules in cancer systems
Helen L. Kotze, Emily G. Armitage, John S. Fletcher, Alex Henderson, Kaye J. Williams et al.
Surface and Interface Analysis, Journal article 2013
Journal article

Time-of-flight SIMS as a novel approach to unlocking the hypoxic properties of cancer
Emily G Armitage, Helen L Kotze, John S. Fletcher, Kaye J Williams, Nicholas P. Lockyer et al.
Surface and Interface Analysis, Journal article 2013
Journal article

Peak picking as a pre-processing technique for imaging time of flight secondary ion mass spectrometry
Jimmy D. Moore, Alex Henderson, John S. Fletcher, Nicholas P. Lockyer, John C. Vickerman
Surface and Interface Analysis, Journal article 2013
Journal article

Comparison of C60 and GCIB primary ion beams for the analysis of cancer cells and tumour sections
John S. Fletcher, Sadia Rabbani, Andrew M. Barber, Nicholas P. Locker, John C. Vickerman
Surface and Interface Analysis, Journal article 2013
Journal article

The inherent problem of transflection-mode infrared spectroscopic microscopy and the ramifications for biomedical single point and imaging applications.
Paul Bassan, Joe Lee, Ashwin Sachdeva, Juliana Pissardini, Konrad M Dorling et al.
The Analyst, Journal article 2013
Journal article


A Comparative Study of Secondary Ion Emission from Water Ice under Ion Bombardment by Au(+), Au(3)(+), and C(60)(+)
Xavier A Conlan, John S. Fletcher, Nicholas P Lockyer, John C Vickerman
Journal of Physical Chemistry C, Journal article 2012
Journal article


Showing 41 - 50 of 87

Page Manager: Katleen Burm|Last update: 9/20/2013

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Utskriftsdatum: 2020-08-12