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John Fletcher

Senior lecturer

John Fletcher
Senior lecturer
john.fletcher@chem.gu.se
+46 31 786 9105
0766-229105

Room number: 4032
Postal Address: Kemigården 4, 412 96 Göteborg
Visiting Address: Kemigården 4 , 412 96 Göteborg


Department of Chemistry & Molecular Biology (More Information)
Box 462
405 30 Göteborg
www.cmb.gu.se
inst.kmb@cmb.gu.se
Fax: +46 31 786 2599
Visiting Address: Medicinaregatan 9 C , 405 30 Göteborg

About John Fletcher

 

My groups research is focused on the development and application of imaging mass spectrometry for biological analysis. Mass spectrometry provides molecular specific chemical information without the need to incorporate exogenous labels. When used in an imaging modality this chemical precision is combined with precise spatial distribution. Secondary ion mass spectrometry (SIMS) uses a focused ion beam to probe the surface of a sample and the nature of the ion beam fired at the sample can ultimately determine what chemical species are detected in the mass spectrometer.
As there is a constant demand for more signal at higher resolution and so ion beam development is an active area of research particularly using new gas cluster ion beam technology. For biological sample analysis ensuring that the data generated is representative of the "live" sample means that methods to prepare and analyse biological specimen in the vacuum environment required for imaging SIMS are critical.
Combining the new ion beams with optimal sample preperation provides a route to identifying lipidomic changes on a sub-cellular scale, potentially in 3D, in order elucidate the underlying chemical processes involved in disease progression and treatment.

 

Current PhD students

Marwa Munem

Kelly Dimovska Nilsson 

Teaching and Departmental Responsibilities

KEM070 - Basic Analytical Chemistry

KEM081 - Advanced Analytical Chemistry

KEA310 - Introduction to Analytical Chemistry

Analytical Chemistry Project Contact

Coordinator of Chemistry Masters Program

Departmental Strategy Board Member

 

 

Latest publications

Cholesterol Alters the Dynamics of Release in Protein Independent Cell Models for Exocytosis
Neda Najafinobar, Lisa J. Mellander, Michael E. Kurczy, Johan Dunevall, Tina B. Angerer et al.
Scientific Reports, Journal article 2016
Journal article

Showing 21 - 30 of 80

2014

ToF-SIMS imaging of lipids and lipid related compounds in Drosophila brain
Nhu TN Phan, John S. Fletcher, Peter Sjövall, Andrew G Ewing
Surface and Interface Analysis: 19th International Conference on Secondary Ion Mass Spectrometry (SIMS), Conference paper 2014
Conference paper

Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry
Jelena Lovric, Jacqueline Keighron, Tina B. Angerer, Xianchan Li, Per Malmberg et al.
Surface and Interface Analysis: 19th International Conference on Secondary Ion Mass Spectrometry (SIMS), Conference paper 2014
Conference paper

Gold and silver nanoparticle-assisted laser desorption ionization mass spectrometry compatible with secondary ion mass spectrometry for lipid analysis
Amir Saeid Mohammadi, John S. Fletcher, Per Malmberg, Andrew G Ewing
Surface and Interface Analysis: 19th International Conference on Secondary Ion Mass Spectrometry (SIMS), Conference paper 2014
Conference paper

Imaging Mass Spectrometry for Single-Cell Analysis
Nhu TN Phan, John S. Fletcher, Andrew G Ewing
Reference Module in Chemistry, Molecular Sciences and Chemical Engineering, Elsevier, Chapter in book 2014
Chapter in book

Spatiotemporal lipid profiling during early embryo development of Xenopus laevis using dynamic Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Imaging
Hua Tian, John S. Fletcher, Raphael Thuret, Alex Henderson, Nancy Papalopulu et al.
Journal of Lipid Research, Journal article 2014
Journal article

Prospect of increasing secondary ion yields in ToF-SIMS using water cluster primary ion beams
S. Sheraz, A. Barber, I. B. Razo, John S. Fletcher, N. P. Lockyer et al.
Surface and Interface Analysis, Journal article 2014
Journal article

Examination of fragment ions of polystyrene in TOF-SIMS spectra using MS/MS
T. Kawashima, T. Kurosawa, S. Aoyagi, S. Sheraz, John S. Fletcher et al.
Surface and Interface Analysis, Journal article 2014
Journal article

2013

Showing 21 - 30 of 80

Page Manager: Katleen Burm|Last update: 9/20/2013
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